1. High resolution X-ray diffractometry and topography
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : X-ray crystallography.,X-rays- Diffraction.,Crystals
رده :
QD945
.
B683
1998
2. Introduction to the physics of electrons in solids
پدیدآورنده : Tanner, B. K.)Brian Keith(
کتابخانه: Central Library and Documentation Center (Kerman)
موضوع : ، Solid state physics,، Energy-band theory of solids,، Semiconductors
رده :
QC
176
.
T32
1995
3. Introduction to the physics of electrons in solids
پدیدآورنده : Brian K. Tanner
موضوع : Solid state physics,Energy - Band theroy of solids,Semiconductors
۲ نسخه از این کتاب در ۲ کتابخانه موجود است.
4. Introduction to the physics of electrons in solids
پدیدآورنده : / Brian K. Tanner
کتابخانه: Central Library and Document Center of Arak University (Markazi)
موضوع : Solid state physics,Energy-- band theory of solids,Semiconductors
رده :
530
.
411
T166t
5. Introduction to the physics of elements in solids
پدیدآورنده : Brian K. Tanner,Title
کتابخانه: Central Library of Imam Khomeini International University of Qazvin (Qazvin)
موضوع : Solid state physics,Energy-band theory of solid,Semiconductors
رده :
QC
.
T32
176
1995
6. X-ray and neutron dynamical diffraction
پدیدآورنده : / edited by Andrae Authier, Stefano Lagomarsino, and Brian K. Tanner
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : X-rays, Diffraction, Congresses,Neutrons, Diffraction, Congresses,X-ray crystallography, Congresses,Interferometry, Neutron, Congresses
رده :
QC482
.
D5
X68
,
1996
7. X-ray diffraction topography
پدیدآورنده : Tanner, B. K.)Brian Keith(
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : ، X-ray crystallography
رده :
QD
945
.
T36
1976
8. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors--Design and construction--Quality control,Integrated circuits--Measurement,Semiconductor wafers--Inspection,X-rays--Diffraction,Fluroscopy
رده :
TK7874
.
58
.
B69
2006
9. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library and Information Center of the University of Mohaghegh Ardabili (Ardabil)
موضوع : Semiconductors- Design and construction- Quality control,Integrated circuits- Measurement,Semiconductor wafers- Inspection,X-rays- Diffraction,Fluroscopy
رده :
TK7874
.
58
.
B69
2006
10. X-ray metrology in semiconductor manufacturing
پدیدآورنده : / D. Keith Bowen, Brian K. Tanner
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Semiconductors , Design and construction , Quality control,Integrated circuits , Measurement,Semiconductor wafers , Inspection,X-rays , Diffraction,Fluroscopy
رده :
E-BOOK
